NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1398,1401
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.6
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BHK66Y
Production Form:
Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
34.7 2710
35.1 2710
35.6 2690
36.0 2680
36.4 2680
36.8 2680
37.3 2690
37.7 2660
38.1 2660
38.5 2660
39.0 2690
39.4 2690
39.8 2690
40.3 2690
40.7 2690
41.1 2690
41.5 2690
42.0 2690
42.4 2690
42.8 2690
43.3 2690
43.7 2690
44.1 2710
44.5 2700
45.0 2690
45.4 2690
45.8 2680
46.2 2670
46.7 2690
47.1 2710
47.5 2690
48.0 2660
48.4 2640
48.8 2640
49.2 2660
49.7 2640
50.1 2640
50.5 2640
50.9 2640
51.4 2640
51.8 2640
52.2 2640
52.7 2640
53.1 2650
53.5 2660
53.9 2640
54.4 2640
54.8 2640
55.2 2640
55.7 2660
56.1 2640
56.5 2640
56.9 2640
57.4 2640
57.8 2640
58.2 2660
58.6 2640
59.1 2640
59.5 2660
59.9 2640
60.4 2620
60.8 2620
61.2 2620
61.6 2620
62.1 2640
62.5 2630
62.9 2640
63.3 2640
63.8 2640
64.2 2640
64.6 2640
65.1 2630
65.5 2630
65.9 2660
66.3 2640
66.8 2640
67.2 2620
67.6 2640
68.0 2660
68.5 2680
68.9 2660
69.3 2660
69.8 2690
70.2 2660
70.6 2660
71.0 2650
71.5 2660
71.9 2660
72.3 2660
72.8 2660
73.2 2700
73.6 2710
74.0 2690
74.5 2710
74.9 2690
75.3 2690
75.7 2710
76.2 2690
76.6 2710
77.0 2720
77.5 2730
77.9 2780
78.3 2750
78.7 2780
79.2 2790
79.6 2820
80.0 2820
80.4 2800
80.9 2820
81.3 2820
81.7 2880
82.2 2930
82.6 2920
83.0 2910
83.4 2900
83.9 2890
84.3 2960
84.7 2980
85.2 3010
85.6 3040
86.0 3040
86.4 3010
86.9 3070
87.3 3090
87.7 3090
88.1 3130
88.6 3200
89.0 3280
89.4 3310
89.9 3400
90.3 3500
90.7 3540
91.1 3560
91.6 3600
92.0 3650
92.4 3650
92.8 3650
93.3 3650
93.7 3670
94.1 3670
94.6 3670
95.0 3670
95.4 3660
95.8 3660
96.3 3650
96.7 3660
97.1 3660
97.6 3650
98.0 3660
98.4 3670
98.8 3670
99.3 3670
99.7 3670
100.1 3670
100.5 3670
101.0 3650
101.4 3650
101.8 3670
102.3 3670
102.7 3670
103.1 3670
103.5 3670
104.0 3670
104.4 3690
104.8 3690
105.2 3650
105.7 3670
106.1 3670
106.5 3670
107.0 3670
107.4 3650
107.8 3670
108.2 3650
108.7 3680
109.1 3680
109.5 3670
109.9 3670
110.4 3670
110.8 3670
111.2 3670
111.7 3670
112.1 3650
112.5 3670
112.9 3670
113.4 3650
113.8 3650
114.2 3670
114.7 3670
115.1 3670
115.5 3670
115.9 3670
116.4 3670
116.8 3680
117.2 3680
117.6 3670
118.1 3670
118.5 3670
118.9 3650
119.4 3650
119.8 3670
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 3/22/90 Weekday: Thursday Start time: 20:33 End date: 3/23/90 Weekday: Friday End time: 10:00 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity Remark on data: floppy format HP basic LIF

Cautions: Research Data