NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Surface resistance at 9 GHz
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1990 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 1399,1401
Keywords: Material Specification, Surface Resistance

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process:
Notes:
Formula: YBa2Cu3O6.9
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BHK69Y
Production Form:
Surface Resistance for Y:123; [Y-Ba-Cu-O]
Temperature (K) Surface Resistance (mΩ)
46.0 70
46.3 120
46.7 70
47.1 70
47.5 60
47.8 50
48.2 50
48.6 50
48.9 50
49.3 50
49.7 50
50.1 50
50.4 50
50.8 30
51.2 40
51.5 60
51.9 70
52.3 70
52.6 80
53.0 120
53.4 70
53.8 120
54.1 100
54.5 70
54.9 70
55.2 70
55.6 70
56.0 70
56.4 90
56.7 90
57.1 90
57.5 100
57.8 140
58.2 90
58.6 90
59.0 90
59.3 100
59.7 110
60.1 70
60.4 70
60.8 80
61.2 140
61.5 100
61.9 70
62.3 70
62.7 110
63.0 120
63.4 120
63.8 120
64.1 120
64.5 140
64.9 90
65.3 110
65.6 160
66.0 150
66.4 160
66.7 160
67.1 140
67.5 160
67.9 180
68.2 160
68.6 170
69.0 160
69.3 200
69.7 210
70.1 180
70.5 180
70.8 170
71.2 160
71.6 160
71.9 170
72.3 180
72.7 180
73.0 180
73.4 210
73.8 270
74.2 260
74.5 260
74.9 300
75.3 270
75.6 250
76.0 250
76.4 270
76.8 270
77.1 270
77.5 300
77.9 320
78.2 320
78.6 310
79.0 340
79.4 340
79.7 360
80.1 340
80.5 340
80.8 380
81.2 400
81.6 410
81.9 370
82.3 360
82.7 390
83.1 370
83.4 370
83.8 400
84.2 450
84.5 470
84.9 470
85.3 520
85.7 520
86.0 530
86.4 540
86.8 540
87.1 590
87.5 540
87.9 540
88.3 560
88.6 610
89.0 610
89.4 640
89.7 720
90.1 740
90.5 760
90.9 810
91.2 880
91.6 900
92.0 950
92.3 970
92.7 1030
93.1 1040
93.4 1100
93.8 1100
94.2 1120
94.6 1100
94.9 1090
95.3 1100
95.7 1100
96.0 1100
96.4 1150
96.8 1120
97.2 1140
97.5 1130
97.9 1100
98.3 1150
98.6 1120
99.0 1120
99.4 1120
99.8 1170
100.1 1120
100.5 1140
100.9 1150
101.2 1120
101.6 1120
102.0 1160
102.3 1180
102.7 1150
103.1 1160
103.5 1170
103.8 1170
104.2 1130
104.6 1150
104.9 1150
105.3 1150
105.7 1160
106.1 1170
106.4 1170
106.8 1130
107.2 1120
107.5 1120
107.9 1120
108.3 1140
108.7 1140
109.0 1150
109.4 1150
109.8 1170
110.1 1150
110.5 1150
110.9 1150
111.3 1150
111.6 1140
112.0 1120
112.4 1150
112.7 1170
113.1 1150
113.5 1150
113.8 1130
114.2 1150
114.6 1160
115.0 1150
115.3 1150
115.7 1140
116.1 1160
116.4 1150
116.8 1150
117.2 1180
117.6 1190
117.9 1190
118.3 1200
118.7 1210
119.0 1150
119.4 1140
119.8 1120
Measurement Method: Resistivity
Test facility: Faculty of Engineering, the University of Tokyo Location: Rm. 015, Bldg. 6, Faculty of Engineering Start date: 3/22/90 Weekday: Thursday Start time: 13:59 End date: 3/22/90 Weekday: Thursday End time: 19:07 Test equipment (1): synthesized sweeper Model of test equipment (1): HP8340B Test equipment (2): scalar network analyzer Model of test equipment (2): HP8757C Test equipment (3): cryostat Maker of test equipment (3): self-made Test equipment (4): cavity resonator Model of test equipment (4): TE112 Specimen shape: disk Specimen size: 5 mm Thickness: 0.2 mm Specimen holding: being put at the bottom of the cavity Test environment: thin He gas Test temperature: 20 K - 300 K Remark on test: measuring the blank temperature variation separately Data calculation: refer to Maeda, et al., Sogo Jikken-syo Nenho (1990) Data comment: measuring Q value - resonance wave number, calculating surface resistivity Remark on data: floppy format HP basic LIF

Cautions: Research Data