NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: X-ray diffraction
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1992 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 6024
Keywords: Material Specification, Crystallography

Materials and Properties

Bi:2212; [Bi-Sr-Ca-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca-Cu-O] Process:
Notes:
Formula: Bi2Sr2CaCu2O8
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: 92AAGBLA-27,28
Production Form: Thick Film

Crystallography for Bi:2212; [Bi-Sr-Ca-Cu-O]
Crystal System:
Formula Units per Cell:
Space Group:
Cell Parameters
Temp K a Å b Å c Å
296 5.398(3) 5.398(3) 30.916(5)
Measurement Method: X-ray diffraction (XRD)
Test facility: Ibaraki Kenkyu-syo, Hitachi Kasei Location: Ibaraki Kenkyu-syo, Hitachi Kasei Test date: 1989/1/26 Environment temperature: 26 °C Environment humidity: 30 % Laboratory environment: air conditioned X-ray source: Cu Kα Applied voltage: 40 kV Applied current: 20 mA Monochrometer: graphite Filter: no Incident slit: 1 degree, -1 degree, -0.3 mm Scanning range: 2-theta = 3 - 100 degree Sweeping rate: step scanning, preset 2 seconds, step interval = 0.01° Test temperature: room temperature Test equipment: X-ray diffraction equipment Maker of test equipment: Rigaku Model of test equipment: RAD-IIIA Specimen shape: plate Specimen size (length): 2.9 mm Specimen size (width): 10 mm Specimen size (thickness): 0.03 mm Specimen holding: fixed on non-reflection plate using double-face tape and paper tape Specimen treatment: cut with a cutter and scissors Remark on specimen: Si(99.999%) powder is used as standard when measuring lattice constants. Data derivation method: (00l) orientation F = 95.6%, F = (Pobs-Pcal)/(1-Pcal), Pobs=(ΣI(00l)obs)/(ΣI(hkl)obs), Pcal = (ΣI(00l)cal)/(ΣI(hkl)cal)

Cautions: