NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Measurement of critical temperature (Tc)
Author(s): Not Available
Publication: STA Project Data Volume: Not Available Issue: Not Available Year: 1991 Page(s): Not Available
Editor(s): Not Available
Publisher: Science and Technology Agency of Japan
Language: Japanese
Notes: STA sheet number: 6330,6330
Keywords: Material Specification, Resistivity (normal state)

Materials and Properties

Bi:2212; [Bi-Sr-Ca-Cu-O]
Material Specification for Bi:2212; [Bi-Sr-Ca-Cu-O] Process:
Notes:
Formula: Bi2Sr2CaCu2O8+y
Informal Name: Bi:2212
Chemical Family: Bi-Sr-Ca-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer:
Commercial Name:
Production Date:
Lot Number: BSCCO(2212)
Production Form:

Resistivity (normal state) for Bi:2212; [Bi-Sr-Ca-Cu-O]
Magnetic Field (T) Temperature (K) Resistivity (normal state) (mΩ·cm)
0 78.3 0.0041
0 83.2 0.405
0 85.5 0.556
0 86.4 0.679
0 89.9 0.785
0 101.0 0.808
0 123.0 0.791
0 154.0 0.808
0 180.0 0.840
0 210.0 0.882
0 241.0 0.931
0 277.0 0.992
0.1 59.9 0.0116
0.1 65.9 0.0371
0.1 68.9 0.0682
0.1 73.5 0.109
0.1 76.1 0.182
0.1 78.7 0.333
0.1 87.6 0.781
0.1 102.0 0.813
0.3 43.6 0.000354
0.3 49.6 0.0103
0.3 57.7 0.0467
0.3 68.2 0.160
0.3 75.3 0.312
0.3 76.8 0.330
0.3 81.2 0.478
0.3 83.9 0.691
0.3 92.1 0.793
0.3 106.0 0.779
1 35.5 0.0029
1 46.8 0.0439
1 53.1 0.101
1 59.0 0.195
1 68.6 0.338
1 76.1 0.471
1 81.5 0.608
1 85.0 0.735
1 92.2 0.798
1 107.0 0.783
3 32.8 0.00375
3 37.7 0.0402
3 43.0 0.112
3 47.0 0.194
3 50.9 0.293
3 58.0 0.417
3 66.2 0.528
3 76.8 0.644
3 86.7 0.775
3 93.4 0.800
3 106.0 0.779
5 24.6 0.0032
5 35.0 0.0582
5 41.9 0.217
5 49.1 0.393
5 57.0 0.549
5 68.2 0.663
5 83.0 0.762
5 93.6 0.798
7 27.5 0.0226
7 32.1 0.059
7 35.0 0.142
7 40.1 0.263
7 43.3 0.380
7 48.4 0.491
7 54.7 0.627
7 65.6 0.734
7 71.2 0.751
7 78.1 0.769
7 88.7 0.802
7 98.1 0.788
7 110.0 0.779
9 29.0 0.0716
9 35.8 0.238
9 41.2 0.408
9 46.1 0.563
9 51.5 0.687
9 59.3 0.778
9 67.2 0.820
9 75.7 0.813
9 88.1 0.821
9 99.8 0.811
Measurement Method: Resistivity
Test facility: Dept. of Physical Engineering, the University of Tokyo Location: Rm. B021, Bldg. 6, Faculty of Engi., the University of Tokyo Test date: 1987/3/10 Weekday: Monday Start time: 14:00 End time: 23:30 Applied field: 1.8 T Applied current: 20 mA Remark on test: reading voltage manually, averaging two values of voltage between electrodes (made from Dupont 4922 Ag paste) Specimen shape: short bar Specimen length: 0.4 cm Specimen width: 0.25 cm Specimen thickness: 0.015 cm Remark on specimen: scraped by using paper or brush, and polished by using alumina Data calculation: RH = 1.46 x 10-3 cm3/C (296K), if RH = 1/(ne), then n(300K) = 4.28 x 1021 cm-3

Cautions: Research Data