NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Flux Creep in c-Axis Oriented Epitaxial YBa2Cu3O7 Thin Film
Author(s): B. Zhao, S. Kuroumaru, Y. Horie, E. Yanada, T. Aomine, X. Qiu, Y. Zhang, Y. Zhao, P. Xu, L. Li, H. Ohkubo, and S. Mase
Publication: Physica C Volume: 179 Issue: Not Available Year: 1991 Page(s): 138-148
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Not Available
Keywords: Material Specification, Critical Current Density

Materials and Properties

Y:123; [Y-Ba-Cu-O]
Material Specification for Y:123; [Y-Ba-Cu-O] Process: Sputtering
Notes: The authors cite Y. Horie, et al., Physica C, Vol. 170, 513 (1990), and summarize the procedure as follows. "The samples were prepared by means of DC magnetron sputtering."
Formula: YBa2Cu3O7
Informal Name: Y:123
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type:
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Critical Current Density for Y:123; [Y-Ba-Cu-O]
Temperature (K) Critical Current Density (kA/cm2)
10 7900
20 6800
30 6100
35 5100
50 3700
55 3200
60 2200
65 1800
77 300
Measurement Method: Four-probe method
"... a narrow bridge of 50 µm width and 150 µm length was patterned, and silver electrodes were deposited by (DC magnetron sputtering)... the angle... between the magnetic field H and c-axis was changed from... 0°... to 90°..., and H and I were always kept to be perpendicular to each other."

Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.