NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Thermal Expansion of Y2Ba4Cu7O15 in the Temperature Range 10-290 K, and Comparison with YBa2Cu3O7 and YBa2Cu4O8
Author(s): O.V. Alexandrov, M. Francois, T. Graf, and K. Yvon
Publication: Physica C Volume: 172 Issue: Not Available Year: 1991 Page(s): 491-494
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Not Available
Keywords: Material Specification, Crystallography

Materials and Properties

Y:247; [Y-Ba-Cu-O]
Material Specification for Y:247; [Y-Ba-Cu-O] Process: Solid State Reaction
Notes: The authors cite T. Graf et al., Physica B, Vol. 165&166, 1671 (1990), and summarize the procedure as follows. "The powder consisted of the 247 phase and of small quantities of 124 phase ( < 5% volume) and CuO ( < 1% volume)... The oxygen content of the 247 phase was determined by monitoring the weight change of the sample during reduction in hydrogen."
Formula: Y2Ba4Cu7O15.28
Informal Name: Y:247
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Crystallography for Y:247; [Y-Ba-Cu-O]
Crystal System: Orthorhombic
Formula Units per Cell:
Space Group:
Cell Parameters
Temp K a Å b Å c Å
10 3.8277 3.8727 50.3904
40 3.8280 3.8725 50.3776
80 3.8293 3.8732 50.4032
120 3.8294 3.8730 50.4192
160 3.8312 3.8740 50.4480
200 3.8322 3.8750 50.4768
240 3.8328 3.8750 50.4992
280 3.8345 3.8760 50.5344
Measurement Method: X-ray diffraction
The authors cite J. Ihringer, J. Appl. Crystallogr., Vol. 15, 1 (1982), and summarize the procedure as follows. "X-ray diffraction patterns were measured on a Guinier diffractometer equipped with a low-temperature closed-cycle helium cryostat... using monochromatized [Ge(111)] CuKα1 radiation. All spectra were recorded...at intervals of 10 K for 4 h at each temperature, in the θ-range 11-48°, by using scan steps of 0.005° in θ... The measured 2θ-peak positions were corrected by an internal standard (silicon)... The data were analyzed by the Rietveld method."

Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.