Material Specification for Y:247; [Y-Ba-Cu-O]
Process: Solid State Reaction
Notes: The authors cite T. Graf et al., Physica B, Vol. 165&166, 1671 (1990), and summarize the procedure as follows. "The powder consisted of the 247 phase and of small quantities of 124 phase ( < 5% volume) and CuO ( < 1% volume)... The oxygen content of the 247 phase was determined by monitoring the weight change of the sample during reduction in hydrogen."
Formula: Y2Ba4Cu7O15.28
Informal Name: Y:247
Chemical Family: Y-Ba-Cu-O
Chemical Class: Oxide
Structure Type: Polycrystalline
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for Y:247; [Y-Ba-Cu-O]
Crystal System: | Orthorhombic |
Formula Units per Cell: | |
Space Group: |
|
Cell Parameters
Temp
K
|
a
Å
|
b
Å
|
c
Å
|
10 |
3.8277 |
3.8727 |
50.3904 |
40 |
3.8280 |
3.8725 |
50.3776 |
80 |
3.8293 |
3.8732 |
50.4032 |
120 |
3.8294 |
3.8730 |
50.4192 |
160 |
3.8312 |
3.8740 |
50.4480 |
200 |
3.8322 |
3.8750 |
50.4768 |
240 |
3.8328 |
3.8750 |
50.4992 |
280 |
3.8345 |
3.8760 |
50.5344 |
Measurement Method: X-ray diffraction
The authors cite J. Ihringer, J. Appl. Crystallogr., Vol. 15, 1 (1982), and summarize the procedure as follows. "X-ray diffraction patterns were measured on a Guinier diffractometer equipped with a low-temperature closed-cycle helium cryostat... using monochromatized [Ge(111)] CuKα
1 radiation. All spectra were recorded...at intervals of 10 K for 4 h at each temperature, in the θ-range 11-48°, by using scan steps of 0.005° in θ... The measured 2θ-peak positions were corrected by an internal standard (silicon)... The data were analyzed by the Rietveld method."
Cautions: Evaluated Data
Digitized data were obtained from Figure 1 of the paper.