NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Annealing Study on Single Crystal Tl-2223 Superconductors
Author(s): B. Morosin, E.L. Venturini, and D.S. Ginley
Publication: Physica C Volume: 175 Issue: Not Available Year: 1991 Page(s): 241-249
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Not Available
Keywords: Material Specification, Crystallography

Materials and Properties

Tl:2223; [Tl-Ba-Ca-Cu-O]
Material Specification for Tl:2223; [Tl-Ba-Ca-Cu-O] Process: Flux Growth
Notes: The authors cite D.S. Ginley et al., J. Cryst. Growth, Vol. 91, 456 (1988), and summarize the procedure as follows. "... ground and sieved mixed oxide powders of varying stoichiometrics... are directly loaded in Pt crucibles which are tightly fitted with Pt lids and placed into a vertical tube furnace under an oxygen atmosphere. The crucible is rapidly heated to 950 °C in about 5 min by moving it into the preheated furnace and then maitained at that temperature for a heat soak of a few hours. Then, the temperature of the furnace is lowered over a period of 10's of hours to 700 °C and subsequently to 25 °C in 5-10 h."
Formula: Tl2Ba2Ca2Cu3Ox
Informal Name: Tl:2223
Chemical Family: Tl-Ba-Ca-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:
Crystallography for Tl:2223; [Tl-Ba-Ca-Cu-O]
Crystal System: Tetragonal
Formula Units per Cell:
Space Group:
Cell Parameters
O2 Annealing Temperature (°C) Annealing Time (h) Temp K a Å b Å c Å
500 0 296 3.8550(3) -- 35.775(8)
500 24 296 3.8557(5) -- 35.674(8)
500 70 296 3.8545(6) -- 35.641(11)
Measurement Method: X-ray diffraction
"Our intensity data were measured over a hemisphere of k-space (to 60° 2θ) using MoKα radiation and approximately corrected for geometrical factors and absorption, then symmetry equivalent values were averaged to obtain measured structure factors for refinement of various models. Lattice parameters were determined by least-squares refinement of diffractometer settings of 24 hkls with 2θ's between 35-40 (MoKα) distributed uniformly over the entire hemisphere."

Cautions: Evaluated Data