NIST High Temp. Superconducting Materials (HTS) Database:

NIST Standard Reference Database 62

Last Update to Data Content: 1996

DOI: https://doi.org/10.18434/T4KP8J


Bibliographic Information

Title: Lead-Doped Bi2Sr2CuO6: A Superconductor Free of Modulation and Superstructure
Author(s): C.C. Torardi, E.M. McCarron, P.L. Gai, J.B. Parise, J. Ghoroghchian, D.B. Kang, M.H. Whangbo, and J.C. Barry
Publication: Physica C Volume: 176 Issue: Not Available Year: 1991 Page(s): 347-356
Editor(s): Not Available
Publisher: Elsevier Science Publishers B.V.
Language: English
Notes: Not Available
Keywords: Material Specification, Density (mass), Crystallography, Critical Temperature

Materials and Properties

Bi:221; [Bi(Pb)-Sr-Cu-O]
Material Specification for Bi:221; [Bi(Pb)-Sr-Cu-O] Process: Melt Processed
Notes: "Superconducting single crystals... were grown in air in gold crucibles from copper-rich melts... Samples were typically soaked at 950 °C for 12 h, slowly cooled at a rate of 5 °C/h to 850 °C, and then furnace-cooled to room temperature."
Formula: Bi2-xPbxSr2CuO6+x
Informal Name: Bi:221
Chemical Family: Bi(Pb)-Sr-Cu-O
Chemical Class: Oxide
Structure Type: Single Crystal
Manufacturer: In House
Commercial Name: In House
Production Date:
Lot Number:
Production Form:

Density (mass) for Bi:221; [Bi(Pb)-Sr-Cu-O]
Temperature (K) Density (g cm-3)
293 7.169
Measurement Method: X-ray diffraction
"Crystals were selected from the preparations in which the 1/2Bi2O3:PbO2 ratio of the melt was 2-y:y (y = 0.5). Their diffraction patterns were indexed on an Enraf-Nonius CAD4 single-crystal X-ray diffractometer... Structural refinements were performed using a series of computer programs developed by Calabrese." Data were collected using MoKα radiation on the range 1.7 ≤ 2θ ≤ 60.0 degrees.

Cautions: Evaluated Data
Crystallography for Bi:221; [Bi(Pb)-Sr-Cu-O]
Crystal System: Orthorhombic
Formula Units per Cell:
Space Group: Pnan
Cell Parameters
Temp K a Å b Å c Å
293 5.2757(7) 5.3797(8) 24.558(3)
Atomic Coordinates
Atom Temp K a-axis b-axis c-axis
Bi(1) 293 0.9829(4) 0.2681(3) 0.06311(4)
Sr(1) 293 0.9604(6) 0.7530(8) 0.1772(1)
Cu(1) 293 0.4640(12) 0.75 0.25
O(1) 293 0.7071(46) 0.9998(91) 0.2523(12)
O(2) 293 0.4662(62) 0.7667(68) 0.1454(7)
O(3) 293 0.9153(74) 0.6643(73) 0.0716(12)
Measurement Method: X-ray diffraction
"Crystals were selected from the preparations in which the 1/2Bi2O3:PbO2 ratio of the melt was 2-y:y (y = 0.5). Their diffraction patterns were indexed on an Enraf-Nonius CAD4 single-crystal X-ray diffractometer... Structural refinements were performed using a series of computer programs developed by Calabrese." Data were collected using MoKα radiation on the range 1.7 ≤ 2θ ≤ 60.0 degrees.

Cautions: Evaluated Data
Critical Temperature for Bi:221; [Bi(Pb)-Sr-Cu-O]
Critical Temperature (K)
18
Measurement Method: Ac inductance
"Tc data were determined by AC inductance measurements of magnetic flux exclusion."

Cautions: Evaluated Data