NIST Standard Reference Database 30
Last Update to Data Content: 2002
"Strength Characterization of Yttria-Doped Sintered Silicon Nitride," R.K. Govila, Journal of Materials Science, Vol. 20, pp. 4345-4353 (1985), published by Chapman and Hall.Language: English
The specimen was sintered. Sintering aids were 3% Al2O3 and 13% Y2O3. Billets 100 mm x 37 mm were obtainted. Specimens were machined to 32 mm x 6 mm x 3 mm, faces ground lengthwise with 320 diamond grit, edges were chamfered lengthwise.
The measurements were conducted using the four-point bend method in a self-aligned fixture, Instron test machine Model 1125, outer span = 19 mm, inner span = 9.5 mm, crosshead speed = 0.5 mm/min in air.
| Amount of Element ( formula units ) |
Element ( no unit ) |
|---|---|
| 3 | Si |
| 4 | N |
| Density ( g cm-3 ) |
|---|
| 3.0 |
No measurement details were noted.
| Temperature ( °C ) |
Flexural Strength ( MPa ) |
|---|---|
| 20 | 455 ± 68 |
| 800 | 478 ± 29 |
| 900 | 488 ± 15 |
| 1000 | 662 ± 53 |
| 1200 | 267 ± 17 |
| 1300 | 222 ± 13 |
Digitized data were obtained from Figure 4 of the paper.
| Temperature ( °C ) |
Weibull Modulus ( no unit ) |
|---|---|
| 20 | 16.5 |