NIST Structural Ceramics Database (SCD) Database

NIST Standard Reference Database 30

Last Update to Data Content: 2002

DOI: http://dx.doi.org/10.18434/T4F30D


SCD Citation Number: Z00008

Bibliographic Information

Reference:
"Diametral Compression of Silicon Nitride," J.E.O. Ovri and T.J. Davies, Materials Science and Engineering, Vol. 96, pp. 109-116 (1987), published by Elsevier Sequoia.
Language: English

General Materials Processing Notes

"Pressureless sintered silicon nitride (supplied by Turner and Newall Materials Research Limited, Trafford Park, Manchester) was used..." The mass fractions of the sintering aids were 1% MgO and 5 % Y2O3.

Measurement Methods

Compression test
The measurements were made by diametral compressive disc test. Testing machine - Instron Model TT-SML-A06-75), crosshead speed = 0.2 mm/min in air. "In its simplest form, a right circular cylindrical specimen is compressed diametrally between two flat platens. ... A biaxial stress state is produced within the test specimen and, on the assumption of ideal line loading, the vertical plane ... is subjected to a uniform horizontal tensile strength of magnitude σt = 2P/(3.14156*d*t) where σt is the maximum tensile stress, P is the applied load at fracture, d is the specimen diameter, and t is the specimen thickness."
Three-point bend test
The measurements were made by three-point bend method using an Instron (Model TT-CM-A0072) tester with a crosshead speed = 0.5 mm/min in air. Twenty specimens in the as-sintered condition were used.

Index of Materials and Properties

Material Number 1: Si3N4·xMgO·yY2O3

Material Specification and Properties for Si3N4·xMgO·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00008
Chemical Class: Nitride
Chemical Family: Si-N:MgO,Y2O3
Formula: Si3N4·xMgO·yY2O3
Informal Name: silicon nitride
Structure Type: Polycrystalline
Manufacturer: In-House
Process: Sintering

Si3N4·xMgO·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00008
Elemental Composition
Amount of
Element
( formula units )
Element
 
( no unit )
3 Si
4 N
Measurement Method: Reported Formula
Evaluation Status: Unevaluated

Si3N4·xMgO·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00008
Density (mass)
Temperature
 
( °C )
Disk
Thickness
( mm )
Disk
Diameter
( mm )
Density
 
( g cm-3 )
25 4.009 20.454 2.85 ± 0.13
25 4.299 12.587 2.82 ± 0.10
25 4.398 12.351 2.80 ± 0.11

Measurement Method: Unknown
Evaluation Status: Unevaluated

Si3N4·xMgO·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00008
Flexural Strength
Temperature
 
( °C )
Density
 
( g cm3 )
Flexural
Strength
( MPa )
25 2.85 ± 0.13 421±49
Measurement Method: Three-point bend test
Evaluation Status: Evaluated by acceptance criteria

Si3N4·xMgO·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00008
Tensile Strength
Temperature
 
( °C )
Density
 
( g/cm3 )
Disk
Thickness
( mm )
Disk
Diameter
( mm )
Tensile
Strength
( MPa )
25 2.85 ± 0.13 4.009 20.454 168 ± 28
25 2.82 ± 0.10 4.299 12.587 111 ± 20
25 2.80 ± 0.11 4.398 12.351 82 ± 7

Measurement Method: Compression test
Evaluation Status: Evaluated by acceptance criteria