NIST Standard Reference Database 30
Last Update to Data Content: 2002
"Damage-Enhanced Creep in a Siliconized Silicon Carbide: Phenomenology," S.M. Wiederhorn, D.E. Roberts, T. Chuang, and L. Chuck, Journal of the American Ceramic Society, Vol. 71 [7], pp. 602-608 (1988), published by American Ceramic Society.Language: English
"The creep behavior of a commercial grade of reaction-bonded silicon carbide, KX01 was investigated... the material tested consists of a fully dense structure of silicon carbide grains ...imbedded in a silicon... matrix... Silicon carbide particles ranged in size from about 2 µm to 5 µm; however, the particles were not distributed uniformly throughout the solid. Some regions of the solid were virtually free of silicon carbide particles, containing only free silicon while other regions contained agglomerates or clusters of silicon carbide."
"Tensile creep studies were conducted using two very different sets of test equipment. One was of a simple pin and clevis design that depended on accurate machining and centering of the load pins for alignment. Dog-bone shaped test specimens ...were easily mounted in the pull rods used to apply the tensile force. The second fixture ...consists of two levers; its operation is similar to that of a clothespin. The lower lever rests against the flat surface of a ram that exits the bottom of the furnace where it attaches to a load cell. The upper lever is of a split design, consisting of two levers operating independently; this feature reduces bending forces about the broad face of the simple dog-bone shaped specimen. ... The shoulders of the test specimens are rounded to permit self-alignment along an axis perpendicular to the narrow face of the specimen. Specimens for both tests were made by simple grinding... A thin diamond cutting blade was then used to cut specimens from the block. ... Displacements were measured directly on the gauge section of the test specimens. ...for the compressive studies ...specimens about 8 mm by 3 mm by 3 mm were mounted between two pedestals made of the same grade of siliconized silicon carbide as that used for the specimens. Creep was measured from the edge of the pedestal, or from α-SiC fibers attached to the pedestals, using a traveling optical telescope."
| Amount of Element ( formula units ) | Element ( no unit ) |
|---|---|
| 1 | Si |
| 1 | C |
| Stress ( MPa ) | Stress State | Temperature ( °C ) | Creep Rate ( 10-9 s-1 ) |
|---|---|---|---|
| 60 | tension | 1300 | 1.5 |
| 79 | tension | 1300 | 3.2 |
| 90 | tension | 1300 | 6.0 |
| 100 | tension | 1300 | 11 |
| 106 | tension | 1300 | 14 |
| 120 | tension | 1300 | 100 |
| 129 | tension | 1300 | 52 |
| 132 | tension | 1300 | 170 |
| 69 | tension | 1300 | 1.4 |
| 74 | tension | 1300 | 2.6 |
| 83 | tension | 1300 | 3.2 |
| 127 | tension | 1300 | 190 |
| 130 | tension | 1300 | 150 |
| 132 | tension | 1300 | 120 |
| 131 | compress | 1300 | 1.7 |
| 143 | compress | 1300 | 1.7 |
| 151 | compress | 1300 | 2.5 |
| 170 | compress | 1300 | 4.7 |
| 189 | compress | 1300 | 3.3 |
| 202 | compress | 1300 | 15 |
| 215 | compress | 1300 | 25 |
| 218 | compress | 1300 | 89 |
| 225 | compress | 1300 | 79 |
| 253 | compress | 1300 | 150 |
| 277 | compress | 1300 | 890 |
The first set of tensile creep values were obtained using the equipment with the pin and clevis design, and the second set of tensile creep values were obtained using the clothespin design apparatus. Digitized data were obtained from Figure 8 of the paper.
| Stress Range ( MPa ) | Stress State | Temperature ( °C ) | Creep Rate Exponent ( no unit ) |
|---|---|---|---|
| 60-100 | tension | 1300 | 3.8 |
| 100-132 | tension | 1300 | 11 |
| 130-190 | compress | 1300 | 3.5 |
| 190-270 | compress | 1300 | 14 |
| Density ( g cm-3 ) |
|---|
| 2.924 |
No measurement details were noted.