NIST Structural Ceramics Database (SCD) Database

NIST Standard Reference Database 30

Last Update to Data Content: 2002

DOI: http://dx.doi.org/10.18434/T4F30D


SCD Citation Number: Z00036

Bibliographic Information

Reference:
"Damage-Enhanced Creep in a Siliconized Silicon Carbide: Phenomenology," S.M. Wiederhorn, D.E. Roberts, T. Chuang, and L. Chuck, Journal of the American Ceramic Society, Vol. 71 [7], pp. 602-608 (1988), published by American Ceramic Society.
Language: English

General Materials Processing Notes

"The creep behavior of a commercial grade of reaction-bonded silicon carbide, KX01 was investigated... the material tested consists of a fully dense structure of silicon carbide grains ...imbedded in a silicon... matrix... Silicon carbide particles ranged in size from about 2 µm to 5 µm; however, the particles were not distributed uniformly throughout the solid. Some regions of the solid were virtually free of silicon carbide particles, containing only free silicon while other regions contained agglomerates or clusters of silicon carbide."

Measurement Methods

Creep test (tension)
"Tensile creep studies were conducted using two very different sets of test equipment. One was of a simple pin and clevis design that depended on accurate machining and centering of the load pins for alignment. Dog-bone shaped test specimens ...were easily mounted in the pull rods used to apply the tensile force. The second fixture ...consists of two levers; its operation is similar to that of a clothespin. The lower lever rests against the flat surface of a ram that exits the bottom of the furnace where it attaches to a load cell. The upper lever is of a split design, consisting of two levers operating independently; this feature reduces bending forces about the broad face of the simple dog-bone shaped specimen. ... The shoulders of the test specimens are rounded to permit self-alignment along an axis perpendicular to the narrow face of the specimen. Specimens for both tests were made by simple grinding... A thin diamond cutting blade was then used to cut specimens from the block. ... Displacements were measured directly on the gauge section of the test specimens. ...for the compressive studies ...specimens about 8 mm by 3 mm by 3 mm were mounted between two pedestals made of the same grade of siliconized silicon carbide as that used for the specimens. Creep was measured from the edge of the pedestal, or from α-SiC fibers attached to the pedestals, using a traveling optical telescope."

Index of Materials and Properties

SCD Citation Number: Z00036
Material Number 1: SiC

Material Specification and Properties for SiC

Material number 1 of 1
in SCD Citation Number: Z00036
Chemical Class: Carbide
Chemical Family: Si-C
Formula: SiC
Informal Name: silicon carbide
Structure Type: Polycrystalline
Manufacturer: Sohio Engineered Materials Co.
Commercial Name: KX-01
Process: Reaction Bonding

SiC

Material number 1 of 1
in SCD Citation Number: Z00036
Elemental Composition
Amount of
Element
( formula units )
Element
 
( no unit )
1 Si
1 C

Measurement Method: Reported Formula
Evaluation Status: Unevaluated

SiC

Material number 1 of 1
in SCD Citation Number: Z00036
Creep Rate
Stress
 
( MPa )
Stress
State
 
Temperature
 
( °C )
Creep Rate
 
( 10-9 s-1 )
60 tension 1300 1.5
79 tension 1300 3.2
90 tension 1300 6.0
100 tension 1300 11
106 tension 1300 14
120 tension 1300 100
129 tension 1300 52
132 tension 1300 170
69 tension 1300 1.4
74 tension 1300 2.6
83 tension 1300 3.2
127 tension 1300 190
130 tension 1300 150
132 tension 1300 120
131 compress 1300 1.7
143 compress 1300 1.7
151 compress 1300 2.5
170 compress 1300 4.7
189 compress 1300 3.3
202 compress 1300 15
215 compress 1300 25
218 compress 1300 89
225 compress 1300 79
253 compress 1300 150
277 compress 1300 890
Measurement Method: Creep test (tension)
Evaluation Status: Evaluated by acceptance criteria
Cautions:
The first set of tensile creep values were obtained using the equipment with the pin and clevis design, and the second set of tensile creep values were obtained using the clothespin design apparatus. Digitized data were obtained from Figure 8 of the paper.

SiC

Material number 1 of 1
in SCD Citation Number: Z00036
Creep Rate Exponent
Stress
Range
( MPa )
Stress
State
 
Temperature
 
( °C )
Creep Rate
Exponent
( no unit )
60-100 tension 1300 3.8
100-132 tension 1300 11
130-190 compress 1300 3.5
190-270 compress 1300 14

Measurement Method: Creep test (tension)
Evaluation Status: Evaluated by acceptance criteria

SiC

Material number 1 of 1
in SCD Citation Number: Z00036
Density (mass)
Density
 
( g cm-3 )
2.924

Measurement Method: Unknown
Evaluation Status: Unevaluated
Cautions:
No measurement details were noted.