NIST Structural Ceramics Database(SCD) Database - NIST Ceramics Data Portal

NIST Structural Ceramics Database (SCD) Database

NIST Standard Reference Database 30

Last Update to Data Content: 2002

DOI: http://dx.doi.org/10.18434/T4F30D

SCD Citation Number: Z00095

Bibliographic Information

Reference:

"Engineering Properties of Diamond and Graphite," P.D. Ownby and R.W. Stewart, Engineered Materials Handbook, Vol. 4, pp. 821-834 (1991), edited by S.J. Schneider, Jr., published by ASM International.

Language: English
Notes: Subtitle: Ceramics and Glasses

General Materials Processing Notes

"Natural diamonds are produced deep within the earth's crust at extremely high temperatures and pressures. ...diamonds are produced commercially by the simultaneous application of static high pressure and temperature to graphite in specially designed tetrahedral, "belt," or cubic presses, with or without catalysts, such as nickel, iron, manganese, chromium, or cobalt. The catalysis method produces most of the synthesized commercial industrial diamond used throughout the world, in the (micrometer) to millimeter size range. A variation of this method utilizing the above catalysts as solvents is used to synthesize polycrystalline diamond... usually in the form of disks or hemispheres, (5 to 10) mm... in diameter... diamond films can be synthesized metastably by chemical vapor deposition (CVD). This thin film CVD process has been greatly advanced over the past decade via hot filament, ion beam, combustion moderation, sputter deposition, glow and microwave discharges, electron bombardment, direct current, radio frequency, laser, and reactive pulse plasmas... Various hydrocarbon CVD precursors have been used successfully including methane, ethanol, ethylene, benzene, and monosubstituted benzenes... the kinetics of these CVD processes do not allow sufficient time for the ideal cubic lattice plane stacking sequence to always occcur, thus creating, in general, a mixture of diamond polytypes in the deposited film."

Measurement Methods

Typical

Typical values usually are representative of trends of values commonly found for a general class of materials and are not necessarily the best or most appropriate values for any particular material.

Index of Materials and Properties

Material Number 1: C

Material Specification and Properties for C

Material number 1 of 1
in SCD Citation Number: Z00095
Chemical Class: Elemental Solid
Chemical Family: C
Formula: C
Informal Name: diamond
Manufacturer: Typical
Process:

C

Material number 1 of 1
in SCD Citation Number: Z00095

Elemental Composition
Amount of Element ( formula units )	Element ( no unit )
1	C

Measurement Method: Reported Formula
Evaluation Status: Unevaluated

C

Material number 1 of 1
in SCD Citation Number: Z00095

Bulk Modulus
Observed Range ( GPa )	Type	Bulk Modulus ( GPa )
440-590	Natural	515
290-372	Polycrystal	330

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Compressive Strength
Observed Range ( GPa )	Type	Compressive Strength ( GPa )
8.68-16.5	Natural	12
4.5-5.8	Synthetic	5
1.9-6.9	Polycrystal	4

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Crystal Cell Axes
Space Group	Polytype	Temperature ( °C )	Axis	Axis Length ( Å )
FD3M	3C	23	a	3.5597
P6₃/mmc	2H	23	a	2.5221
P6₃/mmc	2H	23	c	4.1186
P6₃/mmc	4H	23	a	2.5221
P6₃/mmc	4H	23	c	8.2371
P6₃/mmc	6H	23	a	2.5221
P6₃/mmc	6H	23	c	12.3557
P6₃/mmc	8H	23	a	2.5221
P6₃/mmc	8H	23	c	16.4743

Measurement Method: Typical
Evaluation Status: Typical values only

C

Material number 1 of 1
in SCD Citation Number: Z00095

Density (mass)
Observed Range ( g cm^-3 )	Type	Density ( g cm^-3 )
3.51-3.52	Natural	3.51
3.20-3.52	Synthetic	3.35
3.00-4.00	Polycrystal	3.50
1.80-3.50	Thin film	2.65

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarioy measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Elastic Modulus
Observed Range ( GPa )	Type	Elastic Modulus ( GPa )
700-1200	Natural	950
800-925	Synthetic	860
750-950	Polycrystal	850
535-1035	Thin film	785

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Elasticity Tensor
C(i,j) Component	C(i,j) Value ( GPa )
C(1,1)	1015±65
C(1,2)	225±100
C(4,4)	500±75

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Flexural Strength
Observed Range ( MPa )	Type	Flexural Strength ( MPa )
1050	Natural	1050
800-1400	Synthetic	1100
390-1550	Polycrystal	970

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Fracture Toughness
Observed Range ( MPa m^1/2 )	Type	Fracture Toughness ( MPa m^1/2 )
3.4	Natural	3.4
6.0-10.7	Synthetic	8.5
6.0- 8.8	Polycrystal	7.5

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Friction Coefficient
Observed Range	Type	Friction Coefficient ( no unit )
0.05-0.10	Natural	0.1
0.05-0.15	Synthetic	0.1
0.02-0.40	Polycryst	0.2
0.15-0.45	Thin film	0.3

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Hardness
Observed Range ( GPa )	Type	Hardness ( GPa )
88-147	Natural	115
95-131	Synthetic	115
25-98	Polycrystal	60
29-118	Thin film	75

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Poisson's Ratio
Observed Range	Type	Poisson's Ratio ( no unit )
0.10-0.29	Natural	0.2
0.20	Synthetic	0.2
0.07-0.20	Polycrystal	0.1

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Sound Velocity
Crystal Face	Type	Sound Velocity ( km/s )
(100)	Natural	17.5
(110)	Natural	18.2

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Tensile Strength
Observed Range ( MPa )	Type	Tensile Strength ( MPa )
16.4-32.4	Natural	25
21.6-32.4	Synthetic	25
0.34-1.50	Polycrystal	1

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commmonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Thermal Conductivity
Temperature ( K )	Type	Thermal Conductivity ( W m^-1 K^-1 )
3	Synthetic	10
10	Synthetic	400
40	Synthetic	9200
65	Synthetic	13000
100	Synthetic	12000
290	Synthetic	2200
10	Thin Films	3
100	Thin Films	225
290	Thin Films	930

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.

C

Material number 1 of 1
in SCD Citation Number: Z00095

Thermal Expansion
Temperature ( K )	Type	Thermal Expansion ( 10^-6 K^-1 )
0	Various	0
200	Various	0.1
400	Various	1.5
600	Various	2.6
800	Various	3.2
1000	Various	3.7
1200	Various	4.3
1400	Various	4.7
1600	Various	5.2
1800	Various	5.6

Measurement Method: Typical
Evaluation Status: Typical values only
Cautions:

Data from methods designated as "typical" are only representative of trends of values commonly found and are not necessarily measured values.