NIST Structural Ceramics Database (SCD) Database

NIST Standard Reference Database 30

Last Update to Data Content: 2002

DOI: http://dx.doi.org/10.18434/T4F30D


SCD Citation Number: Z00485

Bibliographic Information

Reference:
"Temperature Dependence of the Thermal Diffusivity/Conductivity of Aluminum Nitride," T.B. Jackson, K.Y. Donaldson, and D.P.H. Hasselman, Journal of the American Ceramic Society, Vol. 73 [8], pp. 2511-2514 (1990), published by American Ceramic Society.
Language: English

General Materials Processing Notes

"Samples were sintered from high-purity AlN powder with 4 wt% Y2O3 added as a sintering aid and oxygen-getter. The AlN and Y2O3 powders were combined in a plastic jar with Al2O3 grinding media and n-hexane and milled for 1 h. After removal of the liquid, cylindrical pellets were uniaxially pressed at 30 MPa and isostatically pressed at 200 MPa. The pellets were heated to 1850 °C and held at that temperature for 10 h in a flowing nitrogen atmosphere. The furnace used was of the graphite resistance-heated type."

Measurement Methods

Laser flash technique
"The samples were coated with a layer of gold with thickness of approximately 0.1 µm to prevent direct transmission of the laser pulse. The gold coating, in turn, was coated with a thin layer of colloidal carbon to enhance the optical coupling between the sample and the laser pulse and to enhance the emissivity... Briefly, at room temperature (18 °C), the specimens were placed in a specimen holder held directly against the sapphire window of the detector, to ensure a maximum detector signal. At temperatures up to 300 °C, the specimens were placed in a small heater located approximately 200 mm from the detector. The IR radiation from the specimen was focused onto the detector element by means of a sapphire lens. The thermal diffusivity was measured using laser pulse energies of approximately 20, 33, 48, and 55 J, attenuated by 0%, 60%, and 78%. ... The increase in specimen thickness with temperature due to thermal expansion was accounted for using a value for the coefficient of thermal expansion of 3.5 x 10-6 °C-1."

Differential scanning calorimetry (DSC)
"The specific heat was measured by differential scanning calorimetry on a specimen prepared concurrently with the thermal diffusivity specimens." No additional measurement details were noted.

Index of Materials and Properties

Material Number 1: AlN

Material Specification and Properties for AlN

Material number 1 of 1
in SCD Citation Number: Z00485
Chemical Class: Nitride
Chemical Family: Al-N:Y2O3
Formula: AlN
Informal Name: aluminum nitride
Structure Type: Polycrystalline
Manufacturer: In-House
Process: Sintering

AlN

Material number 1 of 1
in SCD Citation Number: Z00485
Specific Heat
Temperature
 
( °C )
Density
 
( g/cm3 )
Specific
Heat
( J kg-1 K-1 )
18 3.257 725
134 3.253 906
206 3.251 975
252 3.249 1020
304 3.247 1052

Measurement Method: Differential scanning calorimetry (DSC)
Evaluation Status: Unevaluated

AlN

Material number 1 of 1
in SCD Citation Number: Z00485
Thermal Conductivity
Temperature
 
( °C )
Density
 
( g/cm3 )
Thermal
Conductivity
( W m-1 K-1 )
18 3.257 208
134 3.253 156
206 3.251 128
252 3.249 106
304 3.247 92

Measurement Method: Laser flash technique
Evaluation Status: Evaluated by acceptance criteria

AlN

Material number 1 of 1
in SCD Citation Number: Z00485
Thermal Diffusivity
Temperature
 
( °C )
Density
 
( g/cm3 )
Thermal
Diffusivity
( cm2 s-1 )
18 3.257 0.88
134 3.253 0.53
206 3.251 0.41
252 3.249 0.32
304 3.247 0.27

Measurement Method: Laser flash technique
Evaluation Status: Evaluated by acceptance criteria