NIST Structural Ceramics Database (SCD) Database

NIST Standard Reference Database 30

Last Update to Data Content: 2002

DOI: http://dx.doi.org/10.18434/T4F30D


SCD Citation Number: Z00585

Bibliographic Information

Reference:
"Thermal Diffusivity of SiO2 and Y2O3 Added AlN Ceramics," T. Yagi, K. Shinozaki, N. Mizutani, M. Kato, and A. Tsuge, Journal of Materials Science, Vol. 24, pp. 1332-1336 (1989), published by Chapman and Hall.
Language: English

General Materials Processing Notes

"... AlN ceramics with both SiO2 and Y2O3 added were investigated. Simultaneous addition of SiO2 and Y2O3: 3 wt% SiO2 (Wako-Junyaku Co Ltd) and 8 wt% Y2O3 (Shin'etsukagaku Ltd) were added to the AlN powder (Toshiba Corporation Research and Development Center), which was prepared by reduction process of Al2O3, and mixed in butyl alcohol. After drying, the mixture was formed into pellets by isostatic-pressing at 1000 kg cm-2. The compact bodies were sintered in an AlN crucible at 1400 °C, 1500 °C, 1600 °C, 1700 °C and 1800 °C for 2 h in (0.1 MPa = 1 atm) of nitrogen. Two-step addition of SiO2 and Y2O3: In the first step, SiO2 was added to AlN powder. The mixture was compacted and sintered at 1800 °C for 2 h in (0.1 MPa = 1 atm) of nitrogen. In the second step, sintered AlN bodies with SiO2 were ground in an agate mortar, and then Y2O3 was added to this ground AlN powder. The mixture was compacted and sintered again at 1400 °C, 1600 °C, 1700 °C and 1800 °C for 2 h in (0.1 MPa = 1 atm) of nitrogen."

Measurement Methods

Density method
"The density of the sintered body was calculated using diameter, thickness and weight of specimens."
Laser flash technique
"Thermal diffusivity was measured by a laser-flash method using a ruby laser wavelength = 0.6943 µm) and the liquid nitrogen-cooled InSb infrared detector (TC-3000-NCA, Shinkuriko Co., Ltd) at room temperature. The specimen discs were about 10 mm in diameter and 3 mm thick."

Index of Materials and Properties

Material Number 1: AlN·xSiO2·yY2O3

Material Specification and Properties for AlN·xSiO2·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00585
Chemical Class: Nitride
Chemical Family: Al-N
Formula: AlN·xSiO2·yY2O3
Informal Name: aluminum nitride
Structure Type: Polycrystalline
Manufacturer: In-House
Process: Sintering

AlN·xSiO2·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00585
Density (mass)
Additive
Addition Mode
 
Mass Fraction
of SiO2
( % )
Mass Fraction
of Y2O3
( % )
Sintering
Temperature
( °C )
Density
 
( g cm-3 )
Simultaneous 4 0 1400 1.72
Simultaneous 4 0 1500 1.79
Simultaneous 4 0 1600 1.96
Simultaneous 4 0 1700 2.21
Simultaneous 4 0 1800 2.28
Simultaneous 0 7 1500 2.01
Simultaneous 0 7 1600 2.21
Simultaneous 0 7 1700 3.28
Simultaneous 0 7 1800 3.30
Simultaneous 3 8 1400 2.01
Simultaneous 3 8 1500 2.16
Simultaneous 3 8 1600 2.72
Simultaneous 3 8 1700 3.21
Simultaneous 3 8 1800 3.26
Two-step 3 8 1400 2.09
Two-step 3 8 1600 2.15
Two-step 3 8 1700 3.07
Two-step 3 8 1800 3.26

Measurement Method: Density method
Evaluation Status: Evaluated by acceptance criteria
Cautions:
Data were digitized from Figs. 1 and 7b of the reference.

AlN·xSiO2·yY2O3

Material number 1 of 1
in SCD Citation Number: Z00585
Thermal Diffusivity
Additive
Addition Mode
 
Mass Fraction
of SiO2
( % )
Mass Fraction
of Y2O3
( % )
Sintering
Temperature
( °C )
Thermal
Diffusivity
( cm2 s-1 )
Simultaneous 4 0 1500 0.03
Simultaneous 4 0 1600 0.01
Simultaneous 4 0 1700 0.05
Simultaneous 4 0 1800 0.06
Simultaneous 0 7 1400 0.03
Simultaneous 0 7 1600 0.10
Simultaneous 0 7 1700 0.48
Simultaneous 0 7 1800 0.61
Simultaneous 3 8 1400 0.06
Simultaneous 3 8 1500 0.05
Simultaneous 3 8 1600 0.16
Simultaneous 3 8 1700 0.26
Simultaneous 3 8 1800 0.28
Two-step 3 8 1400 0.03
Two-step 3 8 1600 0.15
Two-step 3 8 1700 0.39
Two-step 3 8 1800 0.35

Measurement Method: Laser flash technique
Evaluation Status: Evaluated by acceptance criteria
Cautions:
Data were digitized from Figs. 5 and 7a of the reference.