NIST Standard Reference Database 30
Last Update to Data Content: 2002
"Thermal Expansion of Gallium Nitride," M. Leszczynski, T. Suski, H. Teisseyre, P. Perlin, I. Grzegory, J. Jun, S. Porowski, and T. Moustakas, Journal of Applied Physics, Vol. 76 [8], pp. 4909-4911 (1994), published by American Institute of Physics.Language: English
"... measurements of GaN (wurzite structure)... were performed on the bulk crystal grown at a pressure of 15 kbar and on a 2 µm layer grown by molecular beam epitaxy at a temperature of 1073 K (20 nm buffer was deposited at 773 K) on (0001) oriented sapphire. Prior to the deposition the sapphire substrate was converted to AlN by exposing it to nitrogen plasma."
"The measurements were performed by using the Bond diffractometer, the double-crystal diffractometer, and the high-resolution diffractometer equipped with a four-reflection (022) Ge monochromator. A set of symmetrical [(00.4), (00.6)] and asymmetrical [(11.3), (11.4) CuKα1] reflections was used for a calculation of lattice constants of GaN and (00.12), (23.4) CuKα1 for the sapphire. The high temperature was obtained in a resistance furnance with 0.1 K stability."
| Specimen Type |
Axis |
Temperature ( K ) |
Axis Length ( Å ) |
|---|---|---|---|
| Bulk | a | 294 | 3.1880 |
| Bulk | a | 343 | 3.1885 |
| Bulk | a | 403 | 3.1891 |
| Bulk | a | 453 | 3.1897 |
| Bulk | a | 503 | 3.1903 |
| Bulk | a | 553 | 3.1910 |
| Bulk | a | 603 | 3.1917 |
| Bulk | a | 653 | 3.1925 |
| Bulk | a | 703 | 3.1935 |
| Bulk | a | 753 | 3.1945 |
| Bulk | c | 294 | 5.18561 |
| Bulk | c | 343 | 5.18633 |
| Bulk | c | 403 | 5.18699 |
| Bulk | c | 453 | 5.18772 |
| Bulk | c | 503 | 5.18841 |
| Bulk | c | 553 | 5.18911 |
| Bulk | c | 603 | 5.19009 |
| Bulk | c | 653 | 5.19232 |
| Bulk | c | 703 | 5.19360 |
| Bulk | c | 753 | 5.19520 |
Reported standard deviations in the values of the lattice parameters: a-axis: 0.0001Å c-axis: 0.0005Å
| Specimen Type |
Axis |
Temperature ( K ) |
Axis Length ( Å ) |
|---|---|---|---|
| Thin Film | a | 294 | 3.1871 |
| Thin Film | a | 343 | 3.1877 |
| Thin Film | a | 403 | 3.1884 |
| Thin Film | a | 453 | 3.1890 |
| Thin Film | a | 503 | 3.1897 |
| Thin Film | a | 553 | 3.1904 |
| Thin Film | a | 603 | 3.1913 |
| Thin Film | a | 653 | 3.1922 |
| Thin Film | a | 703 | 3.1931 |
| Thin Film | a | 753 | 3.1942 |
| Thin Film | c | 294 | 5.1857 |
| Thin Film | c | 343 | 5.1863 |
| Thin Film | c | 403 | 5.1870 |
| Thin Film | c | 453 | 5.1878 |
| Thin Film | c | 503 | 5.1886 |
| Thin Film | c | 553 | 5.1894 |
| Thin Film | c | 603 | 5.1908 |
| Thin Film | c | 653 | 5.1922 |
| Thin Film | c | 703 | 5.1936 |
| Thin Film | c | 753 | 5.1952 |
Reported standard deviations in the values of the lattice parameters: a-axis: 0.0002Å c-axis: 0.0001Å
| Specimen Type |
Axis |
Temperature ( K ) |
Axis Length ( Å ) |
|---|---|---|---|
| Bulk | a | 294 | 4.7577 |
| Bulk | a | 343 | 4.7587 |
| Bulk | a | 403 | 4.7598 |
| Bulk | a | 453 | 4.7610 |
| Bulk | a | 503 | 4.7624 |
| Bulk | a | 553 | 4.7640 |
| Bulk | a | 603 | 4.7657 |
| Bulk | a | 653 | 4.7674 |
| Bulk | a | 703 | 4.7691 |
| Bulk | a | 753 | 4.7713 |
| Bulk | c | 294 | 12.9907 |
| Bulk | c | 343 | 12.9927 |
| Bulk | c | 403 | 12.9960 |
| Bulk | c | 453 | 12.9993 |
| Bulk | c | 503 | 13.0030 |
| Bulk | c | 553 | 13.0076 |
| Bulk | c | 603 | 13.0124 |
| Bulk | c | 653 | 13.0172 |
| Bulk | c | 703 | 13.0230 |
| Bulk | c | 753 | 13.0291 |
Reported standard deviations in the values of the lattice parameters: a-axis: 0.0001Å c-axis: 0.0001Å