NIST Structural Ceramics Database (SCD) Database

NIST Standard Reference Database 30

Last Update to Data Content: 2002

DOI: http://dx.doi.org/10.18434/T4F30D


SCD Citation Number: Z00633

Bibliographic Information

Reference:
"The Thermal Expansions of Thoria, Periclase, and Diamond," B.J. Skinner, American Mineralogist, Vol. 42, pp. 39-55 (1957), published by Mineralogical Society of America.
Language: English

General Materials Processing Notes

"Thoria: The sample used in the present study was the one used by Frondel (1955) in his accurate determination of the cell size. A spectrographic analysis by the United States Geological Survey showed Si and Mg to be the major impurities (0.1% - 0.5%) Periclase: The sample of periclase was a colorless single crystal prepared synthetically by the Norton Company. Diamond: The sample of diamond dust used in the present study was a commerical grade with a grain size less than 1.0 µm. It was comprised of chips from a great many diamonds and is the finest fraction obtained from the crushing of many thousands of diamonds from many localities."

Measurement Methods

X-ray diffraction
"A new high temperature x-ray powder camera has been designed specifically to measure the thermal expansions of minerals from 20 °C to 1000 °C. The camera is a central mount camera, but only those reflections with Bragg angles greater than 45° are recorded. ... All films were measured on a Hilger and Watts Film Measuring Rule #185, ruled to 1.000 mm ± 0.001 mm, and fitted with a sliding vernier ruled to 0.050 mm ± 0.001 mm. Individual measurements could be estimated to 0.02 mm, by interpolation. The x-ray wavelengths used in all calculations were those recommended by Bragg (1947). The stated precisions of measurements in this paper are the standard deviations."

Index of Materials and Properties (Click on a selected Material Number to expand material properties menu)

Material Specification and Properties for ThO2

Material number 1 of 3
in SCD Citation Number: Z00633
Chemical Class: Oxide
Chemical Family: Th-O
Formula: ThO2
Informal Name: thoria
Structure Type: Single Crystal
Manufacturer: In-House
Process: Crystal Growth

ThO2

Material number 1 of 3
in SCD Citation Number: Z00633
Crystal Cell Axes
Axis
 
 
Temperature
 
( °C )
Axis Length
 
( Å )
a 8.5 5.59475
a 25.0 5.59525(10)
a 33.0 5.59557
a 34.1 5.59561
a 103.1 5.59812
a 162.0 5.60040
a 256.2 5.60424
a 343.1 5.60802
a 398.2 5.61069
a 403.0 5.61069
a 404.2 5.61090
a 421.3 5.61189
a 446.0 5.61288
a 495.9 5.61542
a 593.9 5.62044
a 700.0 5.62589
a 787.2 5.63050
Measurement Method: X-ray diffraction
Evaluation Status: Evaluated by acceptance criteria

Material Specification and Properties for MgO

Material number 2 of 3
in SCD Citation Number: Z00633
Chemical Class: Oxide
Chemical Family: Mg-O
Formula: MgO
Informal Name: magnesia
Structure Type: Single Crystal
Manufacturer: Norton Company
Process: Crystal Growth

MgO

Material number 2 of 3
in SCD Citation Number: Z00633
Crystal Cell Axes
Axis
 
 
Temperature
 
( °C )
Axis Length
 
( Å )
a 10.5 4.21130
a 21.0 4.21160
a 25.0 4.21168(20)
a 46.5 4.21243
a 76.5 4.21360
a 131.0 4.21595
a 229.5 4.22090
a 320.6 4.22576
a 404.2 4.23047
a 512.0 4.23679
a 601.8 4.24195
a 703.1 4.24812
Measurement Method: X-ray diffraction
Evaluation Status: Evaluated by acceptance criteria

Material Specification and Properties for C

Material number 3 of 3
in SCD Citation Number: Z00633
Chemical Class: Elemental Solid
Chemical Family: C
Formula: C
Informal Name: diamond
Structure Type: Polycrystalline
Manufacturer: Natural Specimen
Process: Natural Specimen

C

Material number 3 of 3
in SCD Citation Number: Z00633
Crystal Cell Axes
Axis
 
 
Temperature
 
( °C )
Axis Length
 
( Å )
a 21.5 3.56679
a 25.0 3.56680(9)
a 87.2 3.56704
a 157.2 3.56745
a 233.1 3.56802
a 308.5 3.56844
a 377.7 3.56934
a 453.0 3.57019
a 513.3 3.57096
a 584.5 3.57187
a 657.7 3.57291
a 729.2 3.57401
Measurement Method: X-ray diffraction
Evaluation Status: Evaluated by acceptance criteria