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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Arfelli M., Cossu G., Mattogno G., Ferragina C., Massucci M.A., J. Inclusion Phenom. Mol. Recogn. Chem. 9, 161 (1990)DOI:

Instruction:Total Records:   19
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