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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Arfelli M., Mattogno G., Ferragina C., Massucci M.A., J. Inclusion Phenom. Mol. Recogn. Chem. 11, 15 (1991)DOI:

Instruction:Total Records:   27
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