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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Bohmann O., Ahlberg P., Nyholm R., Martensson N., Siegbahn K., Lehn J.M., Chem. Scr. 18, 44 (1981)
Instruction:Total Records:   13
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