NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:

Behner H., Wecker J., Matthee T., Samwer K., Surf. Interface Anal. 18, 685 (1992)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 19

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

SiO₂/Si

103.40

Si/SiO₂

99.40

SiO₂/Si

154.40

Si/SiO₂

151.00

Y₂O₃/SiO₂/Si

102.40

Y₂O₃/SiO₂/Si

99.40

Y/SiO₂/Si

99.40

(ZrO₂)₉₁(Y₂O₃)₉/Si

99.40

(ZrO₂)₉₁(Y₂O₃)₉/Si

99.40

Y₂O₃/SiO₂/Si

3d_5/2

158.00

Y₂O₃/SiO₂/Si

3d_3/2

159.80

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_5/2

179.00

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_3/2

181.40

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_5/2

182.90

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_3/2

185.30

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_5/2

179.00

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_3/2

181.40

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_5/2

183.20

(ZrO₂)₉₁(Y₂O₃)₉/Si

3d_3/2

185.50