NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Matches from Scientific Citation:
Craciun V., Reader A.H., Vandenhoudt D.E.W., Best S.P., Hutton R.S., Andrei A., et al., Thin Solid Films 255, 290 (1995)DOI:
Instruction:
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