NIST X-ray Photoelectron Spectroscopy Database

Craciun V., Reader A.H., Vandenhoudt D.E.W., Best S.P., Hutton R.S., Andrei A., et al., Thin Solid Films 255, 290 (1995)DOI:

Instruction:

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Total Records: 5

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Si	14	O₂/Si₀.₈Ge₀.₂/Si	2p	103.40
O	8	O₂/Si₀.₈Ge₀.₂/Si	1s	532.90
Si	14	Si/O₂	2p	99.00
Si	14	Si/O₂	2p	103.40
O	8	O₂/Si	1s	532.90