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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Contour J.P., Salesse A., Froment M., Garreau M., Thevenin J., Warin D., J. Microsc. Spectrosc. Electron.. 4, 483 (1979)
Instruction:Total Records:   13
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