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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Farrow R.F.C., Dennis P.N.J., Bishop H.E., Smart N.R., Wotherspoon J.T.M., Thin Solid Films 88, 87 (1982)DOI:

Instruction:Total Records:   14
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