NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:

Farrow R.F.C., Dennis P.N.J., Bishop H.E., Smart N.R., Wotherspoon J.T.M., Thin Solid Films 88, 87 (1982)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 14

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

AP-3d_5/2, M₄N₄₅N₄₅

788.80

CdTe

AP-3d_5/2, M₄N₄₅N₄₅

787.40

CdTeO₃

AP-3d_5/2, M₄N₄₅N₄₅

785.80

CdO

AP-3d_5/2, M₄N₄₅N₄₅

787.00

CdTe₂O₅

AP-3d_5/2, M₄N₄₅N₄₅

786.00

CdTeO₃

AP-1s, KL₂₃L₂₃(¹D)

1042.40

TeO₂

AP-1s, KL₂₃L₂₃(¹D)

1043.00

CdO

AP-1s, KL₂₃L₂₃(¹D)

1045.60

CdTe₂O₅

AP-1s, KL₂₃L₂₃(¹D)

1043.70

CdTe

AP-3d_5/2, M₄N₄₅N₄₅

1063.40

CdTeO₃

AP-3d_5/2, M₄N₄₅N₄₅

1062.40

TeO₂

AP-3d_5/2, M₄N₄₅N₄₅

1063.40

CdTe₂O₅

AP-3d_5/2, M₄N₄₅N₄₅

1063.00

AP-3d_5/2, M₄N₄₅N₄₅

1065.00