There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Hayashi Y., Toriumi K., Isobe K., J. Am. Chem. Soc. 110, 3666 (1988)DOI:

Instruction:Total Records:   7
An error has occurred. This application may no longer respond until reloaded. Reload 🗙