NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Matches from Scientific Citation:
Halverson D.E., Cocke D.L., Thin Solid Films 155, 133 (1987)DOI:
Instruction:
- Click the column to sort in ascending or descending order.
- Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
- Click on the hyperlink in the column for more information.