NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:

Ingo G.M., Zacchetti N., High Temperature Science 28, 137 (1990)
Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 44

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Cr₂₄Fe₇₆/O₂

2p_3/2

709.40

Cr₂₄Fe₇₆/O₂

2p_3/2

710.70

Si₃N₄

398.60

Si₃N₄

398.56

SiN₀.₀₅

397.55

SiN₀.₃₅

397.67

SiN₀.₄₅

397.69

SiN₀.₇₃

397.80

SiN₁.₃₃

397.88

SiN₁.₇₀

397.99

SiN₀.₀₅

396.85

SiN₀.₃₅

396.97

SiN₀.₄₅

396.99

SiN₀.₇₃

397.10

SiN₀.₈₂

397.10

SiN₀.₉₁

397.35

SiN₀.₈₂

397.80

SiN₀.₉₁

398.05

SiN₁.₃₃

398.58

SiN₁.₇₀

398.69

Si₃N₄

397.90

Si₃N₄

397.86

2p_3/2

99.79

2p_3/2

99.81

Si₃N₄

2p_3/2

102.34

Si₃N₄

2p_3/2

102.32

SiN₀.₀₅

2p_3/2

100.11

SiN₀.₃₅

2p_3/2

100.62

SiN₀.₈₂

2p_3/2

100.75

SiN₀.₉₁

2p_3/2

100.85