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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Kerkhof F.P.J., Moulijn J.A., Heeres A., J. Electron Spectrosc. Relat. Phenom. 14, 453 (1978)DOI:

Instruction:Total Records:   4
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