NIST X-ray Photoelectron Spectroscopy Database

Kibel M.H., Leech P.W., Surf. Interface Anal. 24, 605 (1996)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 20

Element	Atomic No	Formula	Spectral Line	Energy (eV)

Ge	32	Ge	L₃M₄₅M₄₅(¹G)	1145.20
Ge	32	GeO₂	L₃M₄₅M₄₅(¹G)	1137.90
Ge	32	Si₀.₃₈₀Ge₀.₀₅O₀.₆₁₅	L₃M₄₅M₄₅(¹G)	1137.20
Ge	32	Si₀.₃₉₇Ge₀.₉O₀.₅₉₄	L₃M₄₅M₄₅(¹G)	1136.60
Ge	32	Si₀.₂₉₇Ge₀.₁₁₅O₀.₅₈₈	L₃M₄₅M₄₅(¹G)	1137.20
O	8	SiO₂	1s	533.20
O	8	GeO₂	1s	532.30
O	8	Si₀.₃₈₀Ge₀.₀₅O₀.₆₁₅	1s	533.10
O	8	Si₀.₃₉₇Ge₀.₉O₀.₅₉₄	1s	532.70
O	8	Si₀.₂₉₇Ge₀.₁₁₅O₀.₅₈₈	1s	533.70
Si	14	Si	2p	98.90
Si	14	SiO₂	2p	103.80
Si	14	Si₀.₃₈₀Ge₀.₀₅O₀.₆₁₅	2p	103.80
Si	14	Si₀.₃₉₇Ge₀.₉O₀.₅₉₄	2p	103.50
Si	14	Si₀.₂₉₇Ge₀.₁₁₅O₀.₅₈₈	2p	104.50
Ge	32	Si₀.₂₉₇Ge₀.₁₁₅O₀.₅₈₈	3d	33.50
Ge	32	Si₀.₃₉₇Ge₀.₉O₀.₅₉₄	3d	33.60
Ge	32	Si₀.₃₈₀Ge₀.₀₅O₀.₆₁₅	3d	33.30
Ge	32	GeO₂	3d	33.10
Ge	32	Ge	3d	29.40