There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Laajalehto K., Kartio I., Nowak P., Appl. Surf. Sci. 81, 11 (1994)DOI:

Instruction:Total Records:   24
An error has occurred. This application may no longer respond until reloaded. Reload 🗙