There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Laoharojanaphand P., Lin T.J., Stoffer J.O., J. Appl. Polymer Sci. 40, 369 (1990)DOI:

Instruction:Total Records:   20
An error has occurred. This application may no longer respond until reloaded. Reload 🗙