There was a problem with the connection!
U.S. flag

An official website of the United States government

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Loh F.C., Tan K.L., Kang E.T., Europ. Polym. J. 27, 1055 (1991)DOI:

Instruction:Total Records:   34
An error has occurred. This application may no longer respond until reloaded. Reload 🗙