There was a problem with the connection!
U.S. flag

An official website of the United States government

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Liu W.K., Yuen W.T., Stradling R.A., J. Vac. Sci. Technol. B 13, 1539 (1995)DOI:

Instruction:Total Records:   6
An error has occurred. This application may no longer respond until reloaded. Reload 🗙