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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Muehlhoff L., Choyke W.J., Bozack M.J., Yates J.T., Jr., J. Appl. Phys. 60, 2842 (1986)DOI:

Instruction:Total Records:   3
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