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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Murgai V., Huang Y., Ruckman M.W., Raaen S., J. Electron Spectrosc. Relat. Phemon. 50, 195 (1990)DOI:

Instruction:Total Records:   4
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