There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Maireles-Torres P., Olivera-Pastor P., Castellon E.R., Lopez A.J., J. Inclusion Phenom. Mol. Recogn. Chem. 14, 327 (1992)DOI:

Instruction:Total Records:   12
An error has occurred. This application may no longer respond until reloaded. Reload 🗙