There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Nelson A.J., Schwerdtfeger C.R., Wei S.-H., Zunger A., Rioux D., Patel R., and Hochst H., Appl. Phys. Lett. 62, 2557 (1993)DOI:

Instruction:Total Records:   4
An error has occurred. This application may no longer respond until reloaded. Reload 🗙