NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Matches from Scientific Citation:
Ruhrnschopf K., Borgmann D., Wedler G., Thin Solid Films 280, 171 (1996)DOI:
Instruction:
- Click the column to sort in ascending or descending order.
- Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
- Click on the hyperlink in the column for more information.