There was a problem with the connection!

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Ryzhkov M.V., Gubanov V.A., Butzman M.P., Hagstrom A.L., Kurmaev E.Z., J. Electron Spectrosc. Relat. Phenom. 21, 193 (1980)DOI:

Instruction:Total Records:   20
An error has occurred. This application may no longer respond until reloaded. Reload 🗙