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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Steiner P., Reiter F.J., Hoechst H., Huefner S., Fuggle J.C., Phys. Lett. A 66, 229 (1978)DOI:

Instruction:Total Records:   5
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