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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:


Thibaut E., Boutique J., Verbist J.J., Levet J.-C., Noel H., J. Am. Chem. Soc. 104, 5266 (1982)DOI:

Instruction:Total Records:   42
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