NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Matches from Scientific Citation:
Van Oeffelen D.A.G., Van Hooff J.H.C., Schuit G.C.A., J. Catal. 95, 84 (1985)DOI:
Instruction:
- Click the column to sort in ascending or descending order.
- Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
- Click on the hyperlink in the column for more information.