NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Matches from Scientific Citation:
Wang K., Huang C., Xu G., Zhao X., Xia X., Wu N., Xu L., and Li T., Thin Solid Films 252, 139 (1994)DOI:
Instruction:
- Click the column to sort in ascending or descending order.
- Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
- Click on the hyperlink in the column for more information.