NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Matches from Scientific Citation:

Yamauchi T., Kitamura H., Wakai N., Zaima S., Koide Y., and Yasuda Y., J. Vac. Sci. Technol. A 11, 2619 (1993)DOI:

Instruction:

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 18

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

TiSi₂

CS-2p_3/2

0.30

VSi₂

CS-2p_3/2

0.50

Hf₃Si₂

CS-4f_7/2

0.30

ZrSi₂

CS-3d_5/2

0.30

SiO₂/Si

103.20

Si/SiO₂

99.30

Si/SiO₂/Zr

99.10

Si/SiO₂/Zr

98.90

Si/Zr

2p_3/2

99.30

Si/Zr

2p_3/2

98.70

Zr/Ta

3d_5/2

178.80

Zr/Ta

3d_3/2

181.10

Zr/SiO₂/Si

3d_5/2

178.90

Zr/SiO₂/Si

3d_3/2

181.20

Zr/SiO₂/Si

3d_5/2

179.00

Zr/SiO₂/Si

3d_3/2

182.20

Zr/Si

3d_5/2

178.80

Zr/Si

3d_5/2

179.10