NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(^-C₄S(CH₃)(OC₈H₁₇)^-)n

XPS Formula:

carbon atoms not attached to S or O

Name:

poly(3-octyloxy-4-methylthiophene)

CAS Registry No:

Class:

ether, other ring, oxygen, polymer, sulfur

Citation:

Author Name(s):

Lachkar A., Selmani A., Sacher E., Leclerc M.

Journal:

Synthetic Metals 72, 81

DOI:

Pub Year:

1995

book All Records in this Publication

Data Processing:

Photoelectron Line

284.80

0.1

Background Subtraction Method:

Shirley

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The fitting was done in accordance with the stoichiometry. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300