NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 15

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

(^-C₄HS((CH₂)₅CH₃)^-)n

284.80

(^-C₄HS((CH₂)₅CH₃)^-)n

285.70

(^-C₄HS((CH₂)₅CH₃)^-)n

1s, sat

287.15

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

284.80

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

285.70

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

1s, sat

287.15

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

282.90

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

574.80

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

573.95

(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

164.04

(^-C₄HS((CH₂)₅CH₃)^-)n

2p_1/2

165.25

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

164.07

Cr/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

162.04

Ti/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

458.15

Ti/(^-C₄HS((CH₂)₅CH₃)^-)n

2p_3/2

455.70

Data Processing:

Photoelectron Line

2p_3/2

162.04

0.1

Background Subtraction Method:

Shirley

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

15 A Cr/(-C4HS((CH2)5CH3)-)n.The substrate was outgassed by a brief heating to 373 K. The fitting was done in accordance with the stoichiometry. FAT mode. The thickness was measured using a quartz-crystal thickness monitor.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300