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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ti
Formula:
Ti/(-C4HS((CH2)5CH3)-)n
Name:
titanium/poly(3-hexylthiophene)
CAS Registry No:
7440-33-7
Class:
other ring, polymer, sulfur

Citation:
Author Name(s):
Lachkar A., Selmani A., Sacher E.
Journal:
Synthetic Metals 72, 73
DOI:
Pub Year:
1995

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p3/2
Binding Energy (eV)
455.70
Energy Uncertainty:
0.1
Background Subtraction Method:
Shirley
Peak Location Method:
other type of curve fit
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
4.5 A Ti/(-C4HS((CH2)5CH3)-)n.The substrate was outgassed by a brief heating to 373 K. The fitting was done in accordance with the stoichiometry. FAT mode. The thickness was measured using a quartz-crystal thickness monitor.

Specimen:
Specimen:
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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