NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 14

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-2p

0.61

SS-2p_3/2

0.00

SS-2p_3/2

0.00

SS-2p_3/2

-0.44

SS1-2p_3/2

0.70

SS1-2p_3/2

0.76

SS2-2p_3/2

0.20

SS2-2p_3/2

0.20

SS3-2p_3/2

-0.15

SS3-2p_3/2

-0.15

SS4-2p_3/2

-0.40

SS4-2p_3/2

-0.40

SS5-2p_3/2

-0.89

SS5-2p_3/2

-0.89

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-2p_3/2

Surface Core-Level Shift (eV)

0.00

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.30

Lorentzian Width (eV):

0.035

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

151

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Si(110)-(2x8). The sample was cleaned by annealing at ~ 1173 K. FAT mode. The spectra were recorded at normal emission and 55 degrees. Branching ratio = 0.50.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300