NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 14

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

DS-2p

0.61

SS-2p_3/2

0.00

SS-2p_3/2

0.00

SS-2p_3/2

-0.44

SS1-2p_3/2

0.70

SS1-2p_3/2

0.76

SS2-2p_3/2

0.20

SS2-2p_3/2

0.20

SS3-2p_3/2

-0.15

SS3-2p_3/2

-0.15

SS4-2p_3/2

-0.40

SS4-2p_3/2

-0.40

SS5-2p_3/2

-0.89

SS5-2p_3/2

-0.89

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS2-2p_3/2

Surface Core-Level Shift (eV) for the second Layer of Atoms

0.20

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.45

Lorentzian Width (eV):

0.035

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

151

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Si(110)-(2x8). The sample was cleaned by annealing at ~ 1173 K. FAT mode. Emission angle = 55 degrees. Branching ratio = 0.50.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300