NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

ZnSe

zinc selenide

1315-09-9

chalcogenide, II-VI semiconductor, selenide

Citation:

Author Name(s):

Islam R., Rao D.R.

Journal:

J. Electron Spectrosc. Relat. Phenom. 81, 69

DOI:

Pub Year:

1996

book All Records in this Publication

Data Processing:

Photoelectron Line

2p_3/2

1022.20

2.4

Background Subtraction Method:

Shirley

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was Zn52.85Se47.15. FAT mode.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300