NIST X-ray Photoelectron Spectroscopy Database

Click the column to sort in ascending or descending order.
Enter a string in the input box in the column header and press the enter to filter the search result in the selected column.
Click on the hyperlink in the column for more information.

Total Records: 3

Data Processing:

Photoelectron Line

74.90

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared by vapor deposition of 80 nm nickel layer on polycrystaline alpha-Al2O3 substrate and oxidation by annealing (T = 973 K, time = 3h, 80% O2/20 % N2). FAT mode. Emission angle = 15 degrees. FAT mode. Emission angle = 15 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

X-ray Diffraction, Rutherford Backscattering Spectrometry

Specimen Temperature (K):

300